Microelectronics Reliability

Journal: Microelectronics Reliability

Abbreviation

Microelectron. Reliab.

Publisher

Elsevier

ISSN

0026-2714
1872-941X

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Publications1 - 10 of 76

Multiscale simulation of aluminum thin films for the design of highly-reliable MEMS devices
Kubo, Haruka; Ciappa, Mauro; Masunaga, Takayuki; et al. (2009)
Microelectronics Reliability
A multiscale simulation methodology is presented to predict the macroscopic mechanical properties of aluminum thin films with a columnar grain structure from the morphology at microscopic scale. The elasto–plastic characteristics of the thin films are calculated as a function of the grain size, temperature, and strain rate by taking into account creep phenomena. The simulated data are validated by experimental stress–strain curves measured by dedicated microstructures in conjunction with a nanoindentation test equipment.
Lifetime prediction on the base of mission profiles
Ciappa, Mauro (2005)
Microelectronics Reliability
Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current
Perpina, X.; Serviere, J.F.; Saiz, J.; et al. (2006)
Microelectronics Reliability
Virtual reliability assessment of integrated power switches based on multi-domain simulation approach
Solomalala, P.; Saiz, J.; Mermet-Guyennet, M.; et al. (2007)
Microelectronics Reliability
A new built-in screening methodology to achieve zero defects in the automotive environment
Malandruccolo, Vezio; Ciappa, Mauro; Rothleitner, Hubert; et al. (2009)
Microelectronics Reliability
Failure causes generating aluminium protrusion/extrusion
Jacob, Peter; Nicoletti, Giovanni (2013)
Microelectronics Reliability
Electro-thermal simulation of current sharing in silicon and silicon carbide power modules under short circuit condition of typesI and II
Suzuki, Hiroshi; Ciappa, Mauro (2016)
Microelectronics Reliability
Exploring the limits of scanning electron microscopy for the metrology of critical dimensions of photoresist structures in the nanometer range
Ciappa, Mauro; Ilgünsatiroglu, Emre; Illarionov, Alexey Yu (2014)
Microelectronics Reliability
Transient stressing and characterization of thin tunnel oxides
Ciappa, M.; Naitana, A.; Vanzi, M. (1997)
Microelectronics Reliability
Reliability and failure in single crystal silicon MEMS devices
Neels, A.; Dommann, A.; Schifferle, A.; et al. (2008)
Microelectronics Reliability

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Journal: Microelectronics Reliability

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