Microscopy and Microanalysis

Journal: Microscopy and Microanalysis

Abbreviation

Microsc. Microanal.

Publisher

Cambridge University Press

ISSN

1431-9276
1435-8115

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Publications 1 - 10 of 21

Ion Beam Preparation Procedures for Three-dimensional SEM Resolved Kikuchi (EBSD) and Kossel Microdiffraction Analysis of Deformed Metals
Hauffe, W.; Simons, G.; Kunze, Karsten; et al. (2005)
Microscopy and Microanalysis
Investigating space-weathering on the moon using APT
Greer, Jennika; Rout, Surya; Isheim, Dieter; et al. (2021)
Microscopy and Microanalysis
Quantification of Nanoparticles in Dispersions Using Transmission Electron Microscopy
Kaegi, Ralf; Fierz, Martin; Hattendorf, Bodo (2021)
Microscopy and Microanalysis
The quantification of the particle size and the number concentration (PNC) of nanoparticles (NPs) is key for the characterization of nanomaterials. Transmission electron microscopy (TEM) is often considered as the gold standard for assessing the size of NPs; however, the TEM sample preparation suitable for estimating the PNC based on deposited NPs is challenging. Here, we use an ultrasonic nebulizer (USN) to transfer NPs from aqueous suspensions into dried aerosols which are deposited on TEM grids in an electrostatic precipitator of an aerosol monitor. The deposition efficiency of the electrostatic precipitator was ≈2%, and the transport efficiency of the USN was ≈7%. Experiments using SiO2 NPs (50–200 nm) confirmed an even deposition of the nebulized particles in the center of the TEM grids. PNCs of the SiO2 NPs derived from TEM images underestimated the expected PNCs of the suspensions by a factor of up to three, most likely resulting from droplet coagulation and NP aggregation in the USN. Nevertheless, single particles still dominated the PNC. Our approach results in reproducible and even deposition of particles on TEM grids suitable for morphological analysis and allows an estimation of the PNC in the suspensions based on the number of particles detected by TEM.
Methods in Creating, Transferring, & Measuring Cryogenic Samples for APT
Gerstl, Stephan S.A.; Wepf, Roger (2015)
Microscopy and Microanalysis
Imaging ‘Invisible’ Dopant Atoms in Semiconductor Nanocrystals
Gunawan, A.A.; Wills, A.; Mkhoyan, A.; et al. (2012)
Microscopy and Microanalysis
Multipoint Background Analysis: Gaining Precision and Accuracy in Microprobe Trace Element Analysis
Allaz, Julien M.; Williams, Michael L.; Jercinovic, Michael J.; et al. (2019)
Microscopy and Microanalysis
Understanding the Effect of Doping and Epitaxial Strain on the Ferroelectric Polarization of Layered Perovskite Thin Films
Campanini, Marco; Trassin, Morgan; Ederer, Claude; et al. (2017)
Microscopy and Microanalysis
Dynamic Structural Changes due to Metal-Support Interaction under Reactive Conditions
Frey, Hannes; Beck, Arik; Huang, Xing; et al. (2022)
Microscopy and Microanalysis
Confidence Bounds for the Estimation of the Volume Phase Fraction from a Single Image in a Nickel Base Superalloy
Blanc, Rémi; Baylou, Pierre; Germain, Christian; et al. (2010)
Microscopy and Microanalysis
Electron Microprobe Analysis of Minor and Trace Elements in Beam Sensitive Materials: How Far Can We Go?
Julien, Allaz; Popa, Răzvan-Gabriel; Reusser, Eric; et al. (2019)
Microscopy and Microanalysis

Publications 1 - 10 of 21

Journal: Microscopy and Microanalysis

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