Beilstein Journal of Nanotechnology

Journal: Beilstein Journal of Nanotechnology

Abbreviation

Beilstein j. nanotechnol.

Publisher

Beilstein-Institut zur Förderung der Chemischen Wissenschaften

ISSN

2190-4286

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Publications 1 - 10 of 15

Growth and characterization of CNT–TiO2 heterostructures
Zhang, Yucheng; Utke, Ivo; Michler, Johann; et al. (2014)
Beilstein Journal of Nanotechnology
A thriving field in nanotechnology is to develop synergetic functions of nanomaterials by taking full advantages of unique properties of each component. In this context, combining TiO2 nanocrystals and carbon nanotubes (CNTs) offers enhanced photosensitivity and improved photocatalytic efficiency, which is key to achieving sustainable energy and preventing environmental pollution. Hence, it has aroused a tremendous research interest. This report surveys recent research on the topic of synthesis and characterization of the CNT–TiO2 interface. In particular, atomic layer deposition (ALD) offers a good control of the size, crystallinity and morphology of TiO2 on CNTs. Analytical transmission electron microscopy (TEM) techniques such as electron energy loss spectroscopy (EELS) in scanning transmission mode provides structural, chemical and electronic information with an unprecedented spatial resolution and increasingly superior energy resolution, and hence is a necessary tool to characterize the CNT–TiO2 interface, as well as other technologically relevant CNT–metal/metal oxide material systems.
On the use of Raman spectroscopy to characterize mass-produced graphene nanoplatelets
Paton, Keith R.; Despotelis, Konstantinos; Kumar, Naresh; et al. (2023)
Beilstein Journal of Nanotechnology
Raman spectroscopy is one of the most common methods to characterize graphene-related 2D materials, providing information on a wide range of physical and chemical properties. Because of typical sample inhomogeneity, Raman spectra are acquired from several locations across a sample, and analysis is carried out on the averaged spectrum from all locations. This is then used to char-acterize the "quality" of the graphene produced, in particular the level of exfoliation for top-down manufactured materials. Howev-er, these have generally been developed using samples prepared with careful separation of unexfoliated materials. In this work we assess these metrics when applied to non-ideal samples, where unexfoliated graphite has been deliberately added to the exfoliated material. We demonstrate that previously published metrics, when applied to averaged spectra, do not allow the presence of this unexfoliated material to be reliably detected. Furthermore, when a sufficiently large number of spectra are acquired, it is found that by processing and classifying individual spectra, rather than the averaged spectrum, it is possible to identify the presence of this ma-terial in the sample, although quantification of the amount remains approximate. We therefore recommend this approach as a robust methodology for reliable characterization of mass-produced graphene-related 2D materials using confocal Raman spectroscopy.
Ion beam profiling from the interaction with a freestanding 2D layer
Shorubalko, Ivan; Choi, Kyoungjun; Stiefel, Michael; et al. (2017)
Beilstein Journal of Nanotechnology
Recent years have seen a great potential of the focused ion beam (FIB) technology for the nanometer-scale patterning of a freestanding two-dimensional (2D) layer. Experimentally determined sputtering yields of the perforation process can be quantitatively explained using the binary collision theory. The main peculiarity of the interaction between the ion beams and the suspended 2D material lies in the absence of collision cascades, featured by no interaction volume. Thus, the patterning resolution is directly set by the beam diameters. Here, we demonstrate pattern resolution beyond the beam size and precise profiling of the focused ion beams. We find out that FIB exposure time of individual pixels can influence the resultant pore diameter. In return, the pore dimension as a function of the exposure dose brings out the ion beam profiles. Using this method of determining an ion-beam point spread function, we verify a Gaussian profile of focused gallium ion beams. Graphene sputtering yield is extracted from the normalization of the measured Gaussian profiles, given a total beam current. Interestingly, profiling of unbeknown helium ion beams in this way results in asymmetry of the profile. Even triangular beam shapes are observed at certain helium FIB conditions, possibly attributable to the trimer nature of the beam source. Our method of profiling ion beams with 2D-layer perforation provides more information on ion beam profiles than the conventional sharp-edge scan method does.
Tip-enhanced Raman spectroscopic imaging of patterned thiol monolayers
Stadler, Johannes; Schmid, Thomas; Opilik, Lothar; et al. (2011)
Beilstein Journal of Nanotechnology
Full spectroscopic imaging by means of tip-enhanced Raman spectroscopy (TERS) was used to measure the distribution of two isomeric thiols (2-mercaptopyridine (2-PySH) and 4-mercaptopyridine (4-PySH)) in a self-assembled monolayer (SAM) on a gold surface. From a patterned sample created by microcontact printing, an image with full spectral information in every pixel was acquired. The spectroscopic data is in good agreement with the expected molecular distribution on the sample surface due to the microcontact printing process. Using specific marker bands at 1000 cm−1 for 2-PySH and 1100 cm−1 for 4-PySH, both isomers could be localized on the surface and semi-quantitative information was deduced from the band intensities. Even though nanometer size resolution information was not required, the large signal enhancement of TERS was employed here to detect a monolayer coverage of weakly scattering analytes that were not detectable with normal Raman spectroscopy, emphasizing the usefulness of TERS.
Increasing throughput of AFM-based single cell adhesion measurements through multisubstrate surfaces
Miao, Yu; Strohmeyer, Nico; Wang, Jinghe; et al. (2015)
Beilstein Journal of Nanotechnology
Mammalian cells regulate adhesion by expressing and regulating a diverse array of cell adhesion molecules on their cell surfaces. Since different cell types express distinct sets of cell adhesion molecules, substrate-specific adhesion is cell type- and condition-dependent. Single-cell force spectroscopy is used to quantify the contribution of cell adhesion molecules to adhesion of cells to specific substrates at both the cell and single molecule level. However, the low throughput of single-cell adhesion experiments greatly limits the number of substrates that can be examined. In order to overcome this limitation, segmented polydimethylsiloxane (PDMS) masks were developed, allowing the measurement of cell adhesion to multiple substrates. To verify the utility of the masks, the adhesion of four different cell lines, HeLa (Kyoto), prostate cancer (PC), mouse kidney fibroblast and MDCK, to three extracellular matrix proteins, fibronectin, collagen I and laminin 332, was examined. The adhesion of each cell line to different matrix proteins was found to be distinct; no two cell lines adhered equally to each of the proteins. The PDMS masks improved the throughput limitation of single-cell force spectroscopy and allowed for experiments that previously were not feasible. Since the masks are economical and versatile, they can aid in the improvement of various assays.
Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
Wagner, Tino; Beyer, Hannes; Reissner, Patrick; et al. (2015)
Beilstein Journal of Nanotechnology
Frequency modulated Kelvin probe force microscopy (FM-KFM) is the method of choice for high resolution measurements of local surface potentials, yet on coarse topographic structures most researchers revert to amplitude modulated lift-mode techniques for better stability. This approach inevitably translates into lower lateral resolution and pronounced capacitive averaging of the locally measured contact potential difference. Furthermore, local changes in the strength of the electrostatic interaction between tip and surface easily lead to topography crosstalk seen in the surface potential. To take full advantage of the superior resolution of FM-KFM while maintaining robust topography feedback and minimal crosstalk, we introduce a novel FM-KFM controller based on a Kalman filter and direct demodulation of sidebands. We discuss the origin of sidebands in FM-KFM irrespective of the cantilever quality factor and how direct sideband demodulation enables robust amplitude modulated topography feedback. Finally, we demonstrate our single-scan FM-KFM technique on an active nanoelectronic device consisting of a 70 nm diameter InAs nanowire contacted by a pair of 120 nm thick electrodes.
Modeling and optimization of atomic layer deposition processes on vertically aligned carbon nanotubes
Yazdani, Nuri; Chawla, Vipin; Edwards, Eve; et al. (2014)
Beilstein Journal of Nanotechnology
Many energy conversion and storage devices exploit structured ceramics with large interfacial surface areas. Vertically aligned carbon nanotube (VACNT) arrays have emerged as possible scaffolds to support large surface area ceramic layers. However, obtaining conformal and uniform coatings of ceramics on structures with high aspect ratio morphologies is non-trivial, even with atomic layer deposition (ALD). Here we implement a diffusion model to investigate the effect of the ALD parameters on coating kinetics and use it to develop a guideline for achieving conformal and uniform thickness coatings throughout the depth of ultra-high aspect ratio structures. We validate the model predictions with experimental data from ALD coatings of VACNT arrays. However, the approach can be applied to predict film conformality as a function of depth for any porous topology, including nanopores and nanowire arrays.
Advances in NO2 sensing with individual single-walled carbon nanotube transistors
Chikkadi, Kiran; Muoth, Matthias; Roman, Cosmin; et al. (2014)
Beilstein Journal of Nanotechnology
The charge carrier transport in carbon nanotubes is highly sensitive to certain molecules attached to their surface. This property has generated interest for their application in sensing gases, chemicals and biomolecules. With over a decade of research, a clearer picture of the interactions between the carbon nanotube and its surroundings has been achieved. In this review, we intend to summarize the current knowledge on this topic, focusing not only on the effect of adsorbates but also the effect of dielectric charge traps on the electrical transport in single-walled carbon nanotube transistors that are to be used in sensing applications. Recently, contact-passivated, open-channel individual single-walled carbon nanotube field-effect transistors have been shown to be operational at room temperature with ultra-low power consumption. Sensor recovery within minutes through UV illumination or self-heating has been shown. Improvements in fabrication processes aimed at reducing the impact of charge traps have reduced the hysteresis, drift and low-frequency noise in carbon nanotube transistors. While open challenges such as large-scale fabrication, selectivity tuning and noise reduction still remain, these results demonstrate considerable progress in transforming the promise of carbon nanotube properties into functional ultra-low power, highly sensitive gas sensors.
Copper atomic-scale transistors
Xie, Fangqing; Kavalenka, Maryna N.; Röger, Moritz; et al. (2017)
Beilstein Journal of Nanotechnology
We investigated copper as a working material for metallic atomic-scale transistors and confirmed that copper atomic-scale transistors can be fabricated and operated electrochemically in a copper electrolyte (CuSO4 + H2SO4) in bi-distilled water under ambient conditions with three microelectrodes (source, drain and gate). The electrochemical switching-on potential of the atomic-scale transistor is below 350 mV, and the switching-off potential is between 0 and −170 mV. The switching-on current is above 1 μA, which is compatible with semiconductor transistor devices. Both sign and amplitude of the voltage applied across the source and drain electrodes (Ubias) influence the switching rate of the transistor and the copper deposition on the electrodes, and correspondingly shift the electrochemical operation potential. The copper atomic-scale transistors can be switched using a function generator without a computer-controlled feedback switching mechanism. The copper atomic-scale transistors, with only one or two atoms at the narrowest constriction, were realized to switch between 0 and 1G0 (G0 = 2e2/h; with e being the electron charge, and h being Planck’s constant) or 2G0 by the function generator. The switching rate can reach up to 10 Hz. The copper atomic-scale transistor demonstrates volatile/non-volatile dual functionalities. Such an optimal merging of the logic with memory may open a perspective for processor-in-memory and logic-in-memory architectures, using copper as an alternative working material besides silver for fully metallic atomic-scale transistors.
Oriented growth of porphyrin-based molecular wires on ionic crystals analysed by nc-AFM
Glatzel, Thilo; Zimmerli, Lars; Kawai, Shigeki; et al. (2011)
Beilstein Journal of Nanotechnology
The growth of molecular assemblies at room temperature on insulating surfaces is one of the main goals in the field of molecular electronics. Recently, the directed growth of porphyrin-based molecular wires on KBr(001) was presented. The molecule–surface interaction associated with a strong dipole moment of the molecules was sufficient to bind them to the surface; while a stabilization of the molecular assemblies was reached due to the intermolecular interaction by π–π binding. Here, we show that the atomic structure of the substrate can control the direction of the wires and consequently, complex molecular assemblies can be formed. The electronic decoupling of the molecules by one or two monolayers of KBr from the Cu(111) substrate is found to be insufficient to enable comparable growth conditions to bulk ionic materials.

Publications 1 - 10 of 15

Journal: Beilstein Journal of Nanotechnology

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