Journal: IEEE Transactions on Nuclear Science

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Abbreviation

IEEE trans. nucl. sci.

Publisher

IEEE

Journal Volumes

ISSN

0018-9499
1558-1578

Description

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Publications 1 - 10 of 28
  • Rissi, Michael; Otte, Nepomuk; Schweizer, Thomas; et al. (2009)
    IEEE Transactions on Nuclear Science
  • Sedlak, K.; Shiroka, T.; Stoykov, A.; et al. (2010)
    IEEE Transactions on Nuclear Science
  • Fernandes, L. M. P.; Lopes, J. A. M.; Santos, J. M. F. dos; et al. (2004)
    IEEE Transactions on Nuclear Science
  • Collier, Hannah; Limousin, Olivier; Xiao, Hualin; et al. (2024)
    IEEE Transactions on Nuclear Science
    The Spectrometer/Telescope for Imaging X-rays (STIX) is a hard X-ray imaging spectrometer on board the ESA and NASA heliospheric mission Solar Orbiter. STIX has been operational for three years and has observed X-ray emission from similar to 35,000 solar flares. Throughout its lifetime, Solar Orbiter has been frequently struck by a high flux of energetic particles usually of flare origin, or from coronal mass ejection (CME) shocks. These solar energetic particles (SEPs) are detected on board by the purpose-built energetic particle detector (EPD) instrument suite. During SEP events, the X-ray signal is also contaminated in STIX. This work investigates the effect of these particles on the STIX instrument for two events. The first event occurred during an interplanetary shock crossing and the second event occurred when solar orbiter passed through Earth's radiation belts while performing a gravity assist maneuver. The induced spectra consist of tungsten fluorescence emission lines and secondary Bremsstrahlung emission produced by incident particles interacting with spacecraft components. For these two events, we identify >100 keV electrons as significant contributors to the contamination via Bremsstrahlung emission and tungsten fluorescence.
  • Martinella, Corinna; Ziemann, Thomas; Stark, Roger; et al. (2020)
    IEEE Transactions on Nuclear Science
    Heavy-ion microbeams are employed for probing the radiation-sensitive regions in commercial silicon carbide (SiC) vertical double-diffused power (VD)-MOSFETs with micrometer accuracy. By scanning the beam spot over the die, a spatial periodicity was observed in the leakage current degradation, reflecting the striped structure of the power MOSFET investigated. Two different mechanisms were observed for degradation. At low drain bias (gate and source grounded), only the gate-oxide (at the JFET or neck region) is contributing in the ion-induced leakage current. For exposures at drain–source bias voltages higher than a specific threshold, additional higher drain leakage current is observed in the p-n junction region. This provides useful insights into the understanding of basic phenomena of single-event effects in SiC power devices.
  • Goncalves de Medeiros, Helton; Martinella, Corinna; Belanche Guadas, Manuel; et al. (2025)
    IEEE Transactions on Nuclear Science
    Heavy-ion irradiation with different linear energy transfers (LETs) and ion penetration ranges were used to investigate the radiation tolerance of SiC power diodes. Single event leakage current (SELC) degradation was observed for ion ranges shorter than the epitaxial layer thickness. To elucidate the root cause of the observed radiation effects, deep-level transient spectroscopy (DLTS) and minority carrier transient spectroscopy (MCTS) were performed. Both, the ratio between the boron peak contributions and their capture cross-section as measured directly, exhibit a change in value after heavy-ion irradiation.
  • Friederich, Hannes; Davatz, Giovanna; Hartmann, Ueli; et al. (2011)
    IEEE Transactions on Nuclear Science
  • Jiang, Xiaolei; Wang, Zhentian; Zhang, Li; et al. (2013)
    IEEE Transactions on Nuclear Science
  • Rezaeizadeh, Amin; Kalt, Roger; Schilcher, Thomas; et al. (2016)
    IEEE Transactions on Nuclear Science
    Radio Frequency (RF) pulse compressors are used in linear accelerators (Linac) to achieve high power levels by shortening the RF pulse length. In their original form, the phase of the incoming pulse is reversed by 180 ° which generates a high peak power at the output of the pulse compressor, followed by an exponential decay. This pulse shape however is not appropriate with regard to timing stability as well as for having equal energy gain for multi-bunch operation. To achieve flat-topped pulses, a method has been previously proposed that analytically modulates the input phase waveform. In the present contribution an alternative way to producing flat-topped RF pulses is proposed which is based on Iterative Learning Control techniques. This approach manipulates the input waveforms iteratively in order to generate flat-topped amplitude and phase pulses at the output of the pulse compressor.
  • The Mu3e Data Acquisition
    Item type: Journal Article
    Augustin, Heiko; Berger, Niklaus; Bravar, Alessandro; et al. (2021)
    IEEE Transactions on Nuclear Science
    The Mu3e experiment aims to find or exclude the lepton flavor violating decay mu(+) -> e(+)e(-)e(+) with a sensitivity of one in 10(16) muon decays. The first phase of the experiment is currently under construction at the Paul Scherrer Institute (PSI, Switzerland), where beams with up to 10(8) muons per second are available. The detector will consist of an ultra-thin pixel tracker made from High- Voltage Monolithic Active Pixel Sensors (HV-MAPS), complemented by scintillating tiles and fibers for precise timing measurements. The experiment produces about 100 Gbit/s of zero-suppressed data, which are transported to a filter farm using a network of field programmable gate arrays (FPGAs) and fast optical links. On the filter farm, tracks and three-particle vertices are reconstructed using highly parallel algorithms running on graphics processing units, leading to a reduction of the data to 100 Mbyte/s for mass storage and offline analysis. This article introduces the system design and hardware implementation of the Mu3e data acquisition and filter farm.
Publications 1 - 10 of 28