IEEE Design & Test

Journal: IEEE Design & Test

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IEEE

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2168-2364
2168-2356

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Publications 1 - 10 of 16

Internet of Things—The Quest for Trust
Thiele, Lothar (2017)
IEEE Design & Test
Guest Editorial: Robust Resource-Constrained Systems for Machine Learning
Theocharides, Theocharis; Shafique, Muhammad; Choi, Jungwook; et al. (2020)
IEEE Design & Test
Guest Editors' Introduction: Near-Memory and In-Memory Processing
Li, Hai; Alameldeen, Alaa R.; Mutlu, Onur (2022)
IEEE Design & Test
Toward Attention-based TinyML: A Heterogeneous Accelerated Architecture and Automated Deployment Flow
Wiese, Philip; İslamoğlu, Gamze; Scherer, Moritz; et al. (2025)
IEEE Design & Test
One of the challenges for Tiny Machine Learning (tinyML) is keeping up with the evolution of Machine Learning models from Convolutional Neural Networks to Transformers. We address this by leveraging a heterogeneous architectural template coupling RISC-V processors with hardwired accelerators supported by an automated deployment flow. We demonstrate Attention-based models in a tinyML power envelope with an octa-core cluster coupled with an accelerator for quantized Attention. Our deployment flow enables end-to-end 8-bit Transformer inference, achieving leading-edge energy efficiency and throughput of 2960 GOp/J and 154 GOp/s (0.65 V, 22nm FD-SOI technology).
CIRCA-GPUs: Increasing Instruction Reuse through Inexact Computing in GP-GPUs
Rahimi, Abbas; Benini, Luca; Gupta, Rajesh K. (2016)
IEEE Design & Test
Guest Editors’ Introduction: Machine Intelligence at the Edge
Benini, Luca; Chen, Deming; Xiong, Jinjun; et al. (2021)
IEEE Design & Test
Time-Critical Systems Design: A Survey
Mitra, Tulika; Teich, Jürgen; Thiele, Lothar (2018)
IEEE Design & Test
Guest Editors' Introduction: Special Issue on Time-Critical Systems Design
Mitra, Tulika; Teich, Jürgen; Thiele, Lothar (2018)
IEEE Design & Test
A Self-Aware Architecture for PVT Compensation and Power Nap in Near-Threshold Processors
Rossi, Davide; Loi, Igor; Pullini, Antonio; et al. (2017)
IEEE Design & Test
Report of the 2016 Embedded Systems Week (ESWEEK)
Thiele, Lothar; Henkel, Jörg (2017)
IEEE Design & Test

Publications 1 - 10 of 16

Journal: IEEE Design & Test

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