Detection of surface defects on sheet metal parts by using one-shot deflectometry in the infrared range
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Author / Producer
Date
2010
Publication Type
Conference Paper
ETH Bibliography
yes
Citations
Altmetric
OPEN ACCESS
Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
Journal / series
Volume
Pages / Article No.
243 - 254
Publisher
ETH Zurich, IWF
Event
Infrared Camera Applications Conference 2010
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
REFLECTION PHOTOMETRY; METAL PLATES + METAL SHEETS + METAL FILMS (METAL PRODUCTS); INNERE MATERIALFEHLER (MATERIALPRÜFUNG); METALLFILME + METALLFOLIEN + METALLFEINBLECHE (METALLPRODUKTE); INFRAROTGERÄTE (OPTISCHE INSTRUMENTE); REFLEXPHOTOMETRIE; INFRARED INSTRUMENTS (OPTICAL INSTRUMENTS); INTERNAL DEFECTS (MATERIALS TESTING)
Organisational unit
03641 - Wegener, Konrad (emeritus) / Wegener, Konrad (emeritus)
08844 - Kunz, Andreas (Tit.-Prof.) / Kunz, Andreas (Tit.-Prof.)
02623 - Inst. f. Werkzeugmaschinen und Fertigung / Inst. Machine Tools and Manufacturing