Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation
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Author / Producer
Date
2018
Publication Type
Conference Paper
ETH Bibliography
yes
Citations
Altmetric
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Data
Rights / License
Permanent link
Publication status
published
External links
Book title
Proceedings of the ACM on Measurement and Analysis of Computing Systems - SIGMETRICS
Journal / series
Volume
2 (3)
Pages / Article No.
37
Publisher
Association for Computing Machinery
Event
SIGMETRICS '18 ACM International Conference on Measurement and Modeling of Computer Systems
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
3D NAND flash memory; error correction; fault tolerance; reliability; solid-state drives; Storage systems
Organisational unit
09483 - Mutlu, Onur / Mutlu, Onur