Identifying Layers in Random Multiphase Structures
METADATA ONLY
Loading...
Author / Producer
Date
2016
Publication Type
Conference Paper
ETH Bibliography
yes
Citations
Altmetric
METADATA ONLY
Data
Rights / License
Permanent link
Publication status
published
External links
Book title
Proceedings of the 12th International Conference on X-Ray Microscopy (XRM 2014)
Journal / series
Volume
1696
Pages / Article No.
20046
Publisher
American Institute of Physics
Event
12th International Conference on X-Ray Microscopy, XRM 2014
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
X-ray imaging; X-ray microscopy; K-means; Morphology; 3D analysis; 3D structure