In situ compression tests on micron-sized silicon pillars by Raman microscopy
Stress measurements and deformation analysis
OPEN ACCESS
Author / Producer
Date
2008
Publication Type
Journal Article
ETH Bibliography
yes
Citations
Altmetric
OPEN ACCESS
Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
Journal / series
Volume
23 (11)
Pages / Article No.
3040 - 3047
Publisher
MRS
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Organisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph
Notes
Received 16 May 2008, Accepted 8 August 2008. It was possible to publish this article open access thanks to a Swiss National Licence with the publisher