Ion Beam Preparation Procedures for Three-dimensional SEM Resolved Kikuchi (EBSD) and Kossel Microdiffraction Analysis of Deformed Metals
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Author / Producer
Date
2005
Publication Type
Conference Paper
ETH Bibliography
yes
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Rights / License
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Publication status
published
External links
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Book title
Journal / series
Volume
11 (S02)
Pages / Article No.
840 - 841
Publisher
Cambridge University Press
Event
63rd Annual Meeting of the Microscopy Society of America
Edition / version
Methods
Software
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Date collected
Date created
Subject
Organisational unit
03392 - Burg, Jean-Pierre (emeritus)
03307 - Dual, Jürg (emeritus) / Dual, Jürg (emeritus)
Notes
Published online 1 August 2005.