Termination-Dependent Resistive Switching in SrTiO3 Valence Change Memory Cells


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Date

2025-04-08

Publication Type

Journal Article

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yes

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Abstract

Valence change memory (VCM) cells based on SrTiO3 (STO), a perovskite oxide, are a promising type of emerging memory device. While the operational principle of most VCM cells relies on the growth and dissolution of one or multiple conductive filaments, those based on STO are known to exhibit a distinctive “interface-type” switching, which is associated with the modulation of the Schottky barrier at their active electrode. Still, a detailed picture of the processes that lead to interface-type switching is not available. In this work, we use a fully atomistic ab initio model to study the resistive switching of a Pt-STO-Ti stack. We identify that the termination of the crystalline STO plays a decisive role in the switching mechanism, depending on the relative band alignment between the material and the Pt electrode. In particular, we show that the accumulation of oxygen vacancies at the Pt side can be the origin of resistive switching in TiO2-terminated devices by lowering the conduction band minimum of the STO layer, thus facilitating transmission through the Schottky barrier. Moreover, we investigated the possibility of filamentary switching in STO and revealed that it is most likely to occur at the Pt electrode of the SrO-terminated cells.

Publication status

published

Editor

Book title

Volume

7 (7)

Pages / Article No.

2839 - 2847

Publisher

American Chemical Society

Event

Edition / version

Methods

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Geographic location

Date collected

Date created

Subject

Valence Change Memory Cells; Resistive Switching; Interface; Perovskite Oxide; Ab Initio Modeling

Organisational unit

03925 - Luisier, Mathieu / Luisier, Mathieu check_circle

Notes

Funding

198612 - Advanced Learning Methods On Dedicated nano-Devices (ALMOND) (SNF)
214068 - Memristive Metasurface Crossbar for Energy Efficient Neuromorphic Computing (MetaCross) (SNF)

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