Synchrotron X-ray microdiffraction reveals rotational plastic deformation mechanisms in polycrystalline thin films
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Author / Producer
Date
2009
Publication Type
Journal Article
ETH Bibliography
yes
Citations
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Rights / License
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Publication status
published
External links
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Book title
Journal / series
Volume
57 (13)
Pages / Article No.
3738 - 3753
Publisher
Elsevier
Event
Edition / version
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Software
Geographic location
Date collected
Date created
Subject
Microdiffraction; Dislocation mechanics; Micropolar; Mesoscopic
Organisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph
Notes
Received 21 November 2008, Revised 27 March 2009, Accepted 15 April 2009, Available online 21 May 2009.