Gate-stack engineering in n-type Ultrascaled SI Nanowire field-effect transistors
METADATA ONLY
Loading...
Author / Producer
Date
2013-10
Publication Type
Journal Article
ETH Bibliography
yes
Citations
Altmetric
METADATA ONLY
Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
Journal / series
Volume
60 (10)
Pages / Article No.
3325 - 3329
Publisher
IEEE
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Device scaling; Gate leakage; Quantum transport simulation
Organisational unit
03925 - Luisier, Mathieu / Luisier, Mathieu