Robust 2DOF-control of a piezoelectric tube scanner for high speed atomic force microscopy
METADATA ONLY
Author / Producer
Date
2003
Publication Type
Conference Paper
ETH Bibliography
yes
Citations
Altmetric
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Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
2003 American Control Conference (ACC)
Journal / series
Volume
Pages / Article No.
3720 - 3725
Publisher
IEEE
Event
2003 American Control Conference (ACC 2003)
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Organisational unit
Notes
Published online 3 November 2003.