Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: Effect of the aperture edge on the ion current images
METADATA ONLY
Loading...
Author / Producer
Date
2018-11-07
Publication Type
Journal Article
ETH Bibliography
yes
Citations
Altmetric
METADATA ONLY
Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
Journal / series
Volume
124 (17)
Pages / Article No.
174902
Publisher
American Institute of Physics
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Organisational unit
03741 - Vörös, Janos / Vörös, Janos