The impact of hetero-junction and oxide-interface traps on the performance of InAs/Si tunnel FETs
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Author / Producer
Date
2017
Publication Type
Conference Paper
ETH Bibliography
yes
Citations
Altmetric
METADATA ONLY
Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
Proceedings of the 17th International Workshop on Junction Technology (IWJT)
Journal / series
Volume
Pages / Article No.
27 - 30
Publisher
IEEE
Event
17th International Workshop on Junction Technology (IWJT)
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Tunnel FETs; steep slope; trap-assisted tunneling
Organisational unit
03925 - Luisier, Mathieu / Luisier, Mathieu