Quantification of Deep Traps in Nanocrystal Solids, Their Electronic Properties, and Their Influence on Device Behavior
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Author / Producer
Date
2013
Publication Type
Journal Article
ETH Bibliography
yes
Citations
Altmetric
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Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
Journal / series
Volume
13 (11)
Pages / Article No.
5284 - 5288
Publisher
American Chemical Society
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Deep level transient spectroscopy (DLTS); Thermal admittance spectroscopy (TAS); Fourier transform photocurrent spectroscopy (FTPS); Quantum dots; PbS; Photovoltaics
Organisational unit
03895 - Wood, Vanessa / Wood, Vanessa
Notes
Received 27 July 2013, Revised 18 October 2013, Published 28 October 2013.