Metal-Halide Perovskites for Gate Dielectrics in Field-Effect Transistors and Photodetectors Enabled by PMMA Lift-Off Process
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Author / Producer
Date
2018-06-06
Publication Type
Journal Article
ETH Bibliography
yes
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Publication status
published
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Journal / series
Volume
30 (23)
Pages / Article No.
1707412
Publisher
Wiley-VCH
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Edition / version
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Software
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Subject
gate dielectrics; metal‐halide perovskites; micropatterning techniques; photodetectors; thin‐film transistors
Organisational unit
02634 - Institut für Elektronik / Institute for Electronics