In situ Screening Techniques for Defective Oxides in Devices for Automotive Applications
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Author / Producer
Date
2011
Publication Type
Conference Paper
ETH Bibliography
yes
Citations
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Rights / License
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Publication status
published
External links
Editor
Book title
2011 IEEE International Reliability Physics Symposium (IRPS 2011) : Monterey, California, USA, 10 - 14 April 2011
Journal / series
Volume
Pages / Article No.
Publisher
IEEE
Event
2011 IEEE International Reliability Physics Symposium (IRPS 2011)
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Built-In Reliability; Gate Oxide Reliability; STI Defects; Capacitor Reliability; Burn-In