Noise diagnostics of graphene interconnects for atomic-scale electronics
OPEN ACCESS
Loading...
Author / Producer
Date
2021-05-26
Publication Type
Journal Article
ETH Bibliography
no
Citations
Altmetric
OPEN ACCESS
Data
Rights / License
Abstract
Graphene nanogaps are considered as essential building blocks of two-dimensional electronic circuits, as they offer the possibility to interconnect a broad range of atomic-scale objects. Here we provide an insight into the microscopic processes taking place during the formation of graphene nanogaps through the detailed analysis of their low-frequency noise properties. Following the evolution of the noise level, we identify the fundamentally different regimes throughout the nanogap formation. By modeling the resistance and bias dependence of the noise, we resolve the major noise-generating processes: atomic-scale junction-width fluctuations in the nanojunction regime and sub-atomic gap-size fluctuations in the nanogap regime. As a milestone toward graphene-based atomic electronics, our results facilitate the automation of an optimized electrical breakdown protocol for high yield graphene nanogap fabrication.
Permanent link
Publication status
published
External links
Editor
Book title
Journal / series
Volume
5 (1)
Pages / Article No.
57
Publisher
Nature
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Organisational unit
03974 - Leuthold, Juerg / Leuthold, Juerg
02635 - Institut für Elektromagnetische Felder / Institute of Electromagnetic Fields