Understanding latency variation in modern DRAM chips: Experimental characterization, analysis, and optimization
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Author / Producer
Date
2016
Publication Type
Conference Paper
ETH Bibliography
yes
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published
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Book title
Proceedings of the 2016 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Science (SIGMETRICS '16)
Journal / series
Volume
Pages / Article No.
323 - 336
Publisher
Association for Computing Machinery
Event
13th Joint International Conference on Measurement and Modeling of Computer Systems (ACM SIGMETRICS / IFIP Performance 2016)
Edition / version
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Software
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Organisational unit
09483 - Mutlu, Onur / Mutlu, Onur