Damage analysis in Al thin films fatigued at ultrahigh frequencies
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Author / Producer
Date
2006-06
Publication Type
Journal Article
ETH Bibliography
yes
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Altmetric
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Rights / License
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Publication status
published
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Book title
Journal / series
Volume
99 (11)
Pages / Article No.
113501
Publisher
American Institute of Physics
Event
Edition / version
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Software
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Date collected
Date created
Subject
Aluminium; Metallic thin films; Fatigue; Grain boundaries; Voids (solid); Grain growth
Organisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph
Notes
Received 25 September 2005, Accepted 28 February 2006, Published online 1 June 2006.