Electron Microprobe Analysis of Minor and Trace Elements in Beam Sensitive Materials: How Far Can We Go?
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Author / Producer
Date
2019-08
Publication Type
Conference Paper
ETH Bibliography
yes
Citations
Altmetric
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Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
Journal / series
Volume
25 (S2)
Pages / Article No.
2312 - 2313
Publisher
Cambridge University Press
Event
Microscopy & Microanalysis (MM 2019)
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Organisational unit
03958 - Bachmann, Olivier / Bachmann, Olivier
Notes
Conference lecture held on August 7, 2019