In situ Observations and Quantitative Analysis of Short Circuit Probability Due to Ultrahigh Frequency Fatigue
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Author / Producer
Date
2010-09
Publication Type
Journal Article
ETH Bibliography
yes
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Publication status
published
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Journal / series
Volume
10 (3)
Pages / Article No.
366 - 373
Publisher
IEEE
Event
Edition / version
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Software
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Date collected
Date created
Subject
Fatigue; Mechanical properties; Probabilistic approach; Reliability; Short circuit; Surface acoustic wave (SAW); Thin films; Very high cycle fatigue (VHCF); Weakest link
Organisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph
Notes
Received 28 October 2009, Revised 4 February 2010, Accepted 6 March 2010, Published 26 April 2010, Date of current version 9 September 2010.