Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications
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Author / Producer
Date
2009-05-25
Publication Type
Conference Paper
ETH Bibliography
yes
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Publication status
published
External links
Editor
Book title
14th IEEE European Test Symposium 2009
Journal / series
Volume
Pages / Article No.
67 - 72
Publisher
IEEE
Event
14th IEEE European Test Symposium (ETS 2009)
Edition / version
Methods
Software
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Date collected
Date created
Subject
Gate Stress Test; Gate Oxide Reliability; Burn-In; Low Side Switch
Organisational unit
Notes
Publication Date 25-29 May 2009, Current Version Published 24 July 2009.