Electron beam confinement and image contrast enhancement in near field emission scanning electron microscopy
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Author / Producer
Date
2009
Publication Type
Journal Article
ETH Bibliography
yes
Citations
Altmetric
METADATA ONLY
Data
Rights / License
Permanent link
Publication status
published
Editor
Book title
Journal / series
Volume
109 (5)
Pages / Article No.
463 - 466
Publisher
Elsevier
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Field emission; SEM; STM
Organisational unit
Notes
Available online 27 November 2008.