Dopants and Traps in Nanocrystal-Based Semiconductor Thin Films: Origins and Measurement of Electronic Midgap States
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Author / Producer
Date
2020-02-25
Publication Type
Journal Article
ETH Bibliography
yes
Citations
Altmetric
OPEN ACCESS
Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
Journal / series
Volume
2 (2)
Pages / Article No.
398 - 404
Publisher
American Chemical Society
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Nanocrystal thin films; PbS; trap state; electronic midgap state; Fourier transform photocurrent spectroscopy; FTPS; energy-resolved electrochemical impedance spectroscopy; ER-EIS
Organisational unit
03895 - Wood, Vanessa / Wood, Vanessa
09701 - Yarema, Maksym (ehemalig) / Yarema, Maksym (former)