In Situ Measurement and Control of the Fermi Level in Colloidal Nanocrystal Thin Films during Their Fabrication
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Author / Producer
Date
2018-12-20
Publication Type
Journal Article
ETH Bibliography
yes
Citations
Altmetric
Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
Journal / series
Volume
9 (24)
Pages / Article No.
7165 - 7172
Publisher
American Chemical Society
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
in-situ measurement; electronic structure; Fermi level; nanocrystals; quantum dots
Organisational unit
03895 - Wood, Vanessa / Wood, Vanessa