Electronic band structure of the buried SiO2/SiC interface investigated by soft x-ray ARPES
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Author / Producer
Date
2017-03-27
Publication Type
Journal Article
ETH Bibliography
yes
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Rights / License
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Publication status
published
External links
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Book title
Journal / series
Volume
110 (13)
Pages / Article No.
132101
Publisher
American Institute of Physics
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Edition / version
Methods
Software
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Date collected
Date created
Subject
Organisational unit
09480 - Grossner, Ulrike / Grossner, Ulrike