Scanning probe with tuning fork sensor, microfabricated silicon cantilever and conductive tip for microscopy at cryogenic temperature

Metadata only

Author

Date

2006

Type

Journal Article

ETH Bibliography

yes

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Publication status

published

External links

Journal / series

Japanese Journal of Applied Physics

Volume

45(3B)

Pages / Article No.

1992 - 1995

Publisher

The Japan Society of Applied Physics

Subject

scanning probe microscope; atomic force microscope; quartz tuning-fork; conductive tip; microfabrication; cryogenic temperature; quantum device

Organisational unit

03439 - Ensslin, Klaus / Ensslin, Klaus

Notes

Received July 4 2005, revised November 4 2005, accepted November 18 2005. Published online March 27 2006.

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