Scanning probe with tuning fork sensor, microfabricated silicon cantilever and conductive tip for microscopy at cryogenic temperature

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Autor(in)

Datum

2006

Typ

Journal Article

ETH Bibliographie

yes

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Publikationsstatus

published

Externe Links

Zeitschrift / Serie

Japanese Journal of Applied Physics

Band

45(3B)

Seiten / Artikelnummer

1992 - 1995

Verlag

The Japan Society of Applied Physics

Thema

scanning probe microscope; atomic force microscope; quartz tuning-fork; conductive tip; microfabrication; cryogenic temperature; quantum device

Organisationseinheit

03439 - Ensslin, Klaus / Ensslin, Klaus

Anmerkungen

Received July 4 2005, revised November 4 2005, accepted November 18 2005. Published online March 27 2006.

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