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dc.contributor.author
Weibel, David
dc.contributor.author
Schmutz, Jan
dc.contributor.author
Pahud, Olivier
dc.contributor.author
Wissmath, Bartholomaeus
dc.date.accessioned
2017-06-11T17:42:42Z
dc.date.available
2017-06-11T17:42:42Z
dc.date.issued
2015
dc.identifier.issn
1054-7460
dc.identifier.issn
1531-3263
dc.identifier.other
10.1162/PRES_a_00214
dc.identifier.uri
http://hdl.handle.net/20.500.11850/101366
dc.language.iso
en
dc.publisher
MIT Press
dc.title
Measuring Spatial Presence: Introducing and Validating the Pictorial Presence SAM
dc.type
Journal Article
ethz.journal.title
Presence
ethz.journal.volume
24
ethz.journal.issue
1
ethz.journal.abbreviated
Presence (Camb. Mass.)
ethz.pages.start
44
ethz.pages.end
61
ethz.notes
.
ethz.identifier.wos
ethz.identifier.nebis
000697384
ethz.publication.place
Cambridge, MA
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02120 - Dep. Management, Technologie und Ökon. / Dep. of Management, Technology, and Ec.::03356 - Grote, Gudela / Grote, Gudela
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02120 - Dep. Management, Technologie und Ökon. / Dep. of Management, Technology, and Ec.::03356 - Grote, Gudela / Grote, Gudela
ethz.date.deposited
2017-06-11T17:42:55Z
ethz.source
ECIT
ethz.identifier.importid
imp59365337423fd51043
ethz.ecitpid
pub:159165
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T12:36:05Z
ethz.rosetta.lastUpdated
2018-11-02T19:11:27Z
ethz.rosetta.versionExported
true
ethz.COinS
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