Grating enhanced apertureless near-field optical microscopy
dc.contributor.author
Mihaljevic, Josip
dc.contributor.author
Hafner, Christian
dc.contributor.author
Meixner, Alfred J.
dc.date.accessioned
2017-06-11T18:04:28Z
dc.date.available
2017-06-11T18:04:28Z
dc.date.issued
2015-07
dc.identifier.issn
1094-4087
dc.identifier.other
10.1364/OE.23.018401
dc.identifier.uri
http://hdl.handle.net/20.500.11850/102057
dc.language.iso
en
dc.publisher
Optical Society of America
dc.title
Grating enhanced apertureless near-field optical microscopy
dc.type
Journal Article
ethz.journal.title
Optics Express
ethz.journal.volume
23
ethz.journal.issue
14
ethz.journal.abbreviated
Opt. Express
ethz.pages.start
18401
ethz.pages.end
18414
ethz.identifier.wos
ethz.identifier.nebis
001934332
ethz.publication.place
Washington, DC
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02635 - Institut für Elektromagnetische Felder (IEF) / Electromagnetic Fields Laboratory (IEF)::03472 - Professur für Feldtheorie (ehemalig)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02635 - Institut für Elektromagnetische Felder (IEF) / Electromagnetic Fields Laboratory (IEF)::03472 - Professur für Feldtheorie (ehemalig)
ethz.date.deposited
2017-06-11T18:04:44Z
ethz.source
ECIT
ethz.identifier.importid
imp593653471e09c12675
ethz.ecitpid
pub:160180
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T00:27:00Z
ethz.rosetta.lastUpdated
2023-02-06T12:56:57Z
ethz.rosetta.versionExported
true
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Journal Article [120766]