Serial snapshot crystallography for materials science with SwissFEL

Thumbnail
Metadata only
Author
Dejoie, Catherine
Smeets, Stef
Baerlocher, Christian
Tamura, Nobumichi
Pattison, Philip
Abela, Rafael
McCusker, Lynne B.
Show all
Date
2015-05
Type
  • Journal Article
Publication status
published
External links
Search via SFX
Journal / series
IUCrJ
Volume
2
Pages / Article No.
361 - 370
Publisher
International Union of Crystallography
Subject
Serial snapshot crystallography; Multi-microcrystal diffraction; Indexing; Broad-bandpass beam; XFEL
Organisational unit
03401 - Steurer, Walter  
Notes
Received 16 February 2015, Accepted 3 April 2015.
More
Show all metadata
Citations
Cited 6 times in Web of Science
Cited 6 times in Scopus
ETH Bibliography
yes
Altmetrics