Serial snapshot crystallography for materials science with SwissFEL

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Author
Dejoie, Catherine
Smeets, Stef
Baerlocher, Christian
Tamura, Nobumichi
Pattison, Philip
Abela, Rafael
McCusker, Lynne B.
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Date
2015-05
Type
  • Journal Article
Publication status
published
External links
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Journal / series
IUCrJ
Volume
2
Pages / Article No.
361 - 370
Publisher
International Union of Crystallography
Subject
Serial snapshot crystallography; Multi-microcrystal diffraction; Indexing; Broad-bandpass beam; XFEL
Organisational unit
03401 - Steurer, Walter  
Notes
Received 16 February 2015, Accepted 3 April 2015.
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Citations
Cited 5 times in Web of Science
Cited 5 times in Scopus
ETH Bibliography
yes
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