Serial snapshot crystallography for materials science with SwissFEL

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Author

Dejoie, Catherine

Smeets, Stef

Baerlocher, Christian

Tamura, Nobumichi

Pattison, Philip

Abela, Rafael

McCusker, Lynne B.

Date

2015-05

Type

Citations

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Publication status

published

External links

Journal / series

IUCrJ

Volume

2

Pages

361 - 370

Publisher

International Union of Crystallography

Subject

Serial snapshot crystallography; Multi-microcrystal diffraction; Indexing; Broad-bandpass beam; XFEL

Organisational unit

03401 - Steurer, Walter

Notes

Received 16 February 2015, Accepted 3 April 2015.

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