Covering Point Patterns
dc.contributor.author
Lapidoth, Amos
dc.contributor.author
Malaer, Andreas
dc.contributor.author
Wang, Ligong
dc.date.accessioned
2017-06-11T19:14:58Z
dc.date.available
2017-06-11T19:14:58Z
dc.date.issued
2015-09
dc.identifier.issn
0018-9448
dc.identifier.issn
1557-9654
dc.identifier.other
10.1109/TIT.2015.2453946
dc.identifier.uri
http://hdl.handle.net/20.500.11850/104019
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Poisson process
dc.subject
Rate-distortion problem
dc.subject
Side information
dc.subject
Wyner-Ziv problem
dc.subject
Feedforward
dc.title
Covering Point Patterns
dc.type
Journal Article
ethz.journal.title
IEEE Transactions on Information Theory
ethz.journal.volume
61
ethz.journal.issue
9
ethz.journal.abbreviated
IEEE trans. inf. theory
ethz.pages.start
4521
ethz.pages.end
4533
ethz.notes
Manuscript received 25 February 2015, Accepted 27 June 2015.
ethz.identifier.wos
ethz.identifier.nebis
000034939
ethz.publication.place
New York, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02639 - Inst. f. Signal- und Informationsverarb. / Signal and Information Processing Lab.::03529 - Lapidoth, Amos / Lapidoth, Amos
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02639 - Inst. f. Signal- und Informationsverarb. / Signal and Information Processing Lab.::03529 - Lapidoth, Amos / Lapidoth, Amos
ethz.date.deposited
2017-06-11T19:15:29Z
ethz.source
ECIT
ethz.identifier.importid
imp59365374d38c414630
ethz.ecitpid
pub:162702
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T20:48:17Z
ethz.rosetta.lastUpdated
2024-02-01T23:13:52Z
ethz.rosetta.versionExported
true
ethz.COinS
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