Measurement Back-Action in Stacked Graphene Quantum Dots - Research Collection

Metadata only

Author

Bischoff, D.

Eich, M.

Zilberberg, O.

Rössler, C.

Ihn, T.

Ensslin, K.

Date

2015

Type

Journal Article

Citations

Cited 19 times in Web of Science

ETH Bibliography

yes

Altmetrics

Publication status

published

External links

https://doi.org/10.1021/acs.nanolett.5b02167

Journal / series

Nano Letters

Volume

15(9)

Pages / Article No.

6003 - 6008

Publisher

American Chemical Society

Subject

Capacitively coupled double dot; Charge detection; Graphene nanoribbon; Measurement back-action; van der Waals heterostructure

Organisational unit

03439 - Ensslin, Klaus / Ensslin, Klaus
03369 - Blatter, Johann W. / Blatter, Johann W.

Notes

Published online 17 August 2015.

More

Show all metadata

Citations

Cited 19 times in Web of Science

ETH Bibliography

yes

Altmetrics