Measurement Back-Action in Stacked Graphene Quantum Dots

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Author
Bischoff, D.
Eich, M.
Zilberberg, O.
Rössler, C.
Ihn, Thomas M.
Ensslin, K.
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Date
2015
Type
    Journal Article
Publication status
published
External links
Journal / series
Nano Letters
Volume
15(9)
Pages / Article No.
6003 - 6008
Publisher
American Chemical Society
Subject
Capacitively coupled double dot; Charge detection; Graphene nanoribbon; Measurement back-action; van der Waals heterostructure
Organisational unit
03439 - Ensslin, Klaus / Ensslin, Klaus  
03369 - Blatter, Johann W. (emeritus) / Blatter, Johann W. (emeritus)  
08835 - Ihn, Thomas (Tit.-Prof.)
Notes
Published online 17 August 2015.
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Citations
Cited 38 times in Web of Science
Cited 39 times in Scopus
ETH Bibliography
yes
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