
Open access
Date
2015-11Type
- Journal Article
Citations
Cited 13 times in
Web of Science
Cited 13 times in
Scopus
ETH Bibliography
yes
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Abstract
A 30 µm pinhole is introduced in the intermediate focus of the SIM beamline at the Swiss Light Source to improve the spot size at the second downstream focus, which is used here for liquid jet X-ray photoelectron spectroscopy experiments. The 30 µm pinhole reduces the beam dimensions from 250 (v) × 100 (h) µm to 75 × 45 µm for a vertical exit slit of 100 µm. The smaller X-ray spot results in a substantial decrease in the gas-phase contribution of the spectra from 40% down to 20% and will help to simplify the interpretation and peak assignments of future experiments. Show more
Permanent link
https://doi.org/10.3929/ethz-b-000107082Publication status
publishedExternal links
Journal / series
Journal of Synchrotron RadiationVolume
Pages / Article No.
Publisher
Wiley-BlackwellSubject
Gas-phase photoemission; Liquid-air interface; Near-ambient pressure photoemissionOrganisational unit
03389 - Spencer, Nicholas (emeritus) / Spencer, Nicholas (emeritus)
Funding
153578 - Surface Chemistry at the Water-Oxide Nanoparticle Interface (SNF)
More
Show all metadata
Citations
Cited 13 times in
Web of Science
Cited 13 times in
Scopus
ETH Bibliography
yes
Altmetrics