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dc.contributor.author
Brütsch, Rudolf
dc.contributor.author
Tari, Makoto
dc.contributor.author
Froehlich, Klaus
dc.contributor.author
Weiers, Tilman
dc.contributor.author
Vogelsang, Ruben
dc.date.accessioned
2017-10-03T14:51:50Z
dc.date.available
2017-06-08T20:00:32Z
dc.date.available
2017-10-03T14:51:50Z
dc.date.issued
2008
dc.identifier.isbn
978-1-4244-2091-9
en_US
dc.identifier.other
10.1109/ELINSL.2008.4570301
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/10711
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.title
High Voltage Insulation Failure Mechanism
en_US
dc.type
Other Conference Item
ethz.book.title
Conference Record of the 2008 IEEE International Symposium on Electrical Insulation, 2008 (ISEI2008)
en_US
ethz.pages.start
162
en_US
ethz.pages.end
165
en_US
ethz.event
IEEE International Symposium on Electrical Insulation
en_US
ethz.event.date
June 8-11, 2008
en_US
ethz.identifier.nebis
000001760
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
03477 - Fröhlich, Klaus
en_US
ethz.leitzahl.certified
03477 - Fröhlich, Klaus
ethz.date.deposited
2017-06-08T20:00:38Z
ethz.source
ECIT
ethz.identifier.importid
imp59364bf5b6c7577585
ethz.ecitpid
pub:21766
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2017-07-18T10:09:21Z
ethz.rosetta.lastUpdated
2017-10-03T14:51:53Z
ethz.rosetta.exportRequired
false
ethz.rosetta.versionExported
true
ethz.COinS
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