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dc.contributor.author
Kim, Changil
dc.contributor.author
Subr, Kartic
dc.contributor.author
Mitchell, Kenny
dc.contributor.author
Sorkine-Hornung, Alexander
dc.contributor.author
Gross, Markus
dc.date.accessioned
2017-06-11T21:21:45Z
dc.date.available
2017-06-11T21:21:45Z
dc.date.issued
2015
dc.identifier.isbn
978-1-4799-8339-1
dc.identifier.other
10.1109/ICIP.2015.7350981
dc.identifier.uri
http://hdl.handle.net/20.500.11850/107258
dc.language.iso
en
dc.publisher
IEEE
dc.title
Online View Sampling for Estimating Depth from Light Fields
dc.type
Conference Paper
ethz.book.title
2015 IEEE International Conference on Image Processing (ICIP)
ethz.pages.start
1155
ethz.pages.end
1159
ethz.event
2015 IEEE International Conference on Image Processing (ICIP 2015)
ethz.event.location
Québec City, Canada
ethz.event.date
September 27-30, 2015
ethz.notes
.
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::02659 - Institut für Visual Computing / Institute for Visual Computing::03420 - Gross, Markus / Gross, Markus
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::02659 - Institut für Visual Computing / Institute for Visual Computing::03420 - Gross, Markus / Gross, Markus
ethz.date.deposited
2017-06-11T21:22:32Z
ethz.source
ECIT
ethz.identifier.importid
imp593653b7a37c416369
ethz.ecitpid
pub:167695
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-18T15:23:09Z
ethz.rosetta.lastUpdated
2018-11-02T20:39:38Z
ethz.rosetta.versionExported
true
ethz.COinS
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