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dc.contributor.author
Rozbořil, Jakub
dc.contributor.author
Meduňa, Mojmír
dc.contributor.author
Falub, Claudiu V.
dc.contributor.author
Isa, Fabio
dc.contributor.author
von Känel, Hans
dc.date.accessioned
2017-06-11T21:27:17Z
dc.date.available
2017-06-11T21:27:17Z
dc.date.issued
2016-02
dc.identifier.issn
1862-6300
dc.identifier.issn
1862-6319
dc.identifier.issn
0031-8965
dc.identifier.issn
1521-396X
dc.identifier.other
10.1002/pssa.201532643
dc.identifier.uri
http://hdl.handle.net/20.500.11850/107494
dc.language.iso
en
dc.publisher
Wiley
dc.subject
Crystal defects
dc.subject
Ge microcrystals
dc.subject
Patterned Si substrate
dc.subject
X-ray diffraction
dc.title
Strain relaxation in Ge microcrystals studied by high-resolution X-ray diffraction
dc.type
Journal Article
ethz.journal.title
Physica Status Solidi A
ethz.journal.volume
213
ethz.journal.issue
2
ethz.pages.start
463
ethz.pages.end
469
ethz.notes
.
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
001365038
ethz.publication.place
Berlin
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02010 - Departement Physik / Department of Physics::02505 - Laboratorium für Festkörperphysik (LFP) / Laboratory for Solid State Physics (LFP)::03569 - Batlogg, Bertram (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02010 - Departement Physik / Department of Physics::02505 - Laboratorium für Festkörperphysik (LFP) / Laboratory for Solid State Physics (LFP)::03569 - Batlogg, Bertram (emeritus)
ethz.date.deposited
2017-06-11T21:27:42Z
ethz.source
ECIT
ethz.identifier.importid
imp593653bc3ab1c13553
ethz.ecitpid
pub:168094
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T15:20:29Z
ethz.rosetta.lastUpdated
2018-11-02T20:43:40Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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