Reflectance anisotropy spectroscopy as a tool for mechanical characterization of metallic thin films

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Author
Wyss, Andi
Schamel, Matthias
Sologubenko, Alla S.
Denk, Richard
Hohage, Michael
Zeppenfeld, Peter
Spolenak, Ralph
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Date
2015
Type
  • Journal Article
Publication status
published
External links
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Journal / series
Journal of Physics D
Volume
48(41)
Pages
415303
Publisher
Institute of Physics
Subject
Brass; Copper; Plasticity; RAS/RDS; Small-scale mechanics; Strain; Thin film
Organisational unit
03692 - Spolenak, Ralph
02891 - Scientific Centre for OPtical and Electron Microscopy (ScopeM) / Scientific Centre for OPtical and Electron Microscopy (ScopeM)
Notes
Published online 17 September 2015.
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Citations
Cited 4 times in Web of Science
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