Reflectance anisotropy spectroscopy as a tool for mechanical characterization of metallic thin films - Research Collection

Metadata only

Author

Schamel, Matthias

Sologubenko, Alla S.

Hohage, Michael

Zeppenfeld, Peter

Spolenak, Ralph

Date

2015

Type

Journal Article

Citations

Cited 9 times in Scopus

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1088/0022-3727/48/41/415303

Journal / series

Journal of Physics D: Applied Physics

Volume

48(41)

Pages / Article No.

415303

Publisher

Institute of Physics

Subject

Brass; Copper; Plasticity; RAS/RDS; Small-scale mechanics; Strain; Thin film

Organisational unit

03692 - Spolenak, Ralph / Spolenak, Ralph
02891 - ScopeM / ScopeM

Notes

Published online 17 September 2015.

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Citations

Cited 9 times in Scopus

ETH Bibliography

yes

Altmetrics