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dc.contributor.author
Wyss, Andi
dc.contributor.author
Schamel, Matthias
dc.contributor.author
Sologubenko, Alla
dc.contributor.author
Denk, Richard
dc.contributor.author
Hohage, Michael
dc.contributor.author
Zeppenfeld, Peter
dc.contributor.author
Spolenak, Ralph
dc.date.accessioned
2017-06-11T21:29:44Z
dc.date.available
2017-06-11T21:29:44Z
dc.date.issued
2015
dc.identifier.issn
0022-3727
dc.identifier.issn
1361-6463
dc.identifier.other
10.1088/0022-3727/48/41/415303
dc.identifier.uri
http://hdl.handle.net/20.500.11850/107532
dc.language.iso
en
dc.publisher
IOP Publishing
dc.subject
Brass
dc.subject
Copper
dc.subject
Plasticity
dc.subject
RAS/RDS
dc.subject
Small-scale mechanics
dc.subject
Strain
dc.subject
Thin film
dc.title
Reflectance anisotropy spectroscopy as a tool for mechanical characterization of metallic thin films
dc.type
Journal Article
ethz.journal.title
Journal of Physics D: Applied Physics
ethz.journal.volume
48
ethz.journal.issue
41
ethz.journal.abbreviated
J. Phys. D: Appl. Phys.
ethz.pages.start
415303
ethz.size
11 p.
ethz.notes
Published online 17 September 2015.
ethz.identifier.scopus
ethz.identifier.nebis
000025112
ethz.publication.place
Bristol
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00003 - Schulleitung und Dienste::00022 - Bereich VP Forschung / Domain VP Research::02891 - ScopeM / ScopeM
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00003 - Schulleitung und Dienste::00022 - Bereich VP Forschung / Domain VP Research::02891 - ScopeM / ScopeM
ethz.date.deposited
2017-06-11T21:30:41Z
ethz.source
ECIT
ethz.identifier.importid
imp593653bd36b0894566
ethz.ecitpid
pub:168132
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T15:18:42Z
ethz.rosetta.lastUpdated
2024-02-01T23:30:26Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Reflectance%20anisotropy%20spectroscopy%20as%20a%20tool%20for%20mechanical%20characterization%20of%20metallic%20thin%20films&rft.jtitle=Journal%20of%20Physics%20D:%20Applied%20Physics&rft.date=2015&rft.volume=48&rft.issue=41&rft.spage=415303&rft.issn=0022-3727&1361-6463&rft.au=Wyss,%20Andi&Schamel,%20Matthias&Sologubenko,%20Alla&Denk,%20Richard&Hohage,%20Michael&rft.genre=article&rft_id=info:doi/10.1088/0022-3727/48/41/415303&
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