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dc.contributor.author
Liu, Wei
dc.contributor.author
Chikkadi, Kiran
dc.contributor.author
Muoth, Matthias
dc.contributor.author
Hierold, Christofer
dc.contributor.author
Haluska, Miroslav
dc.date.accessioned
2017-06-11T21:55:48Z
dc.date.available
2017-06-11T21:55:48Z
dc.date.issued
2016-01
dc.identifier.other
10.1088/0957-4484/27/1/015201
dc.identifier.uri
http://hdl.handle.net/20.500.11850/108415
dc.language.iso
en
dc.publisher
Institute of Physics
dc.subject
Adhesion metal
dc.subject
Carbon nanotube
dc.subject
CNFET on-resistance
dc.subject
Device lifetime
dc.subject
Electrical contact
dc.title
The impact of Cr adhesion layer on CNFET electrical characteristics
dc.type
Journal Article
ethz.journal.title
Nanotechnology
ethz.journal.volume
27
ethz.journal.issue
1
ethz.pages.start
015201
ethz.size
8 p.
ethz.notes
Published online 24 November 2015.
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
000552937
ethz.publication.place
Bristol
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03609 - Hierold, Christofer / Hierold, Christofer
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03609 - Hierold, Christofer / Hierold, Christofer
ethz.date.deposited
2017-06-11T21:55:53Z
ethz.source
ECIT
ethz.identifier.importid
imp593653ce28dc099899
ethz.ecitpid
pub:169378
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T23:21:56Z
ethz.rosetta.lastUpdated
2020-02-14T16:05:05Z
ethz.rosetta.versionExported
true
ethz.COinS
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