The flip-over effect in pulsed laser deposition: Is it relevant at high background gas pressures?
dc.contributor.author
Ojeda-G-P, Alejandro
dc.contributor.author
Schneider, Christof W.
dc.contributor.author
Döbeli, Max
dc.contributor.author
Lippert, Thomas
dc.contributor.author
Wokaun, Alexander
dc.date.accessioned
2017-11-06T10:29:23Z
dc.date.available
2017-06-11T22:43:17Z
dc.date.available
2017-11-06T10:29:23Z
dc.date.issued
2015-12-01
dc.identifier.issn
0169-4332
dc.identifier.issn
1873-5584
dc.identifier.other
10.1016/j.apsusc.2015.09.184
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/109557
dc.language.iso
en
en_US
dc.publisher
Elsevier
en_US
dc.subject
Flip-over effect
en_US
dc.subject
Angular distribution
en_US
dc.subject
Pulsed laser deposition
en_US
dc.subject
Composition
en_US
dc.subject
Congruent transfer
en_US
dc.subject
Laser spot size
en_US
dc.title
The flip-over effect in pulsed laser deposition: Is it relevant at high background gas pressures?
en_US
dc.type
Journal Article
dc.date.published
2015-09-26
ethz.journal.title
Applied Surface Science
ethz.journal.volume
357
en_US
ethz.journal.issue
Part B
en_US
ethz.journal.abbreviated
Appl. surf. sci.
ethz.pages.start
2055
en_US
ethz.pages.end
2062
en_US
ethz.code.ddc
DDC - DDC::5 - Science::530 - Physics
en_US
ethz.code.ddc
DDC - DDC::5 - Science::540 - Chemistry
en_US
ethz.grant
Development of 2-D and sub-100 nm depth profiling methods for oxide thin films
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
000031422
ethz.publication.place
Amsterdam
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02020 - Dep. Chemie und Angewandte Biowiss. / Dep. of Chemistry and Applied Biosc.::02516 - Inst. f. Chemie- und Bioingenieurwiss. / Inst. Chemical and Bioengineering::03421 - Wokaun, Alexander (emeritus)
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02532 - Institut für Teilchen- und Astrophysik / Inst. Particle Physics and Astrophysics::08619 - Labor für Ionenstrahlphysik (LIP) / Laboratory of Ion Beam Physics (LIP)
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02020 - Dep. Chemie und Angewandte Biowiss. / Dep. of Chemistry and Applied Biosc.::02516 - Inst. f. Chemie- und Bioingenieurwiss. / Inst. Chemical and Bioengineering::03421 - Wokaun, Alexander (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02532 - Institut für Teilchen- und Astrophysik / Inst. Particle Physics and Astrophysics::08619 - Labor für Ionenstrahlphysik (LIP) / Laboratory of Ion Beam Physics (LIP)
ethz.grant.agreementno
143665
ethz.grant.fundername
SNF
ethz.grant.funderDoi
10.13039/501100001711
ethz.grant.program
Projektförderung in Mathematik, Natur- und Ingenieurwissenschaften (Abteilung II)
ethz.date.deposited
2017-06-11T22:43:44Z
ethz.source
ECIT
ethz.identifier.importid
imp593653e4a56dd66021
ethz.ecitpid
pub:170665
ethz.eth
yes
en_US
ethz.availability
Metadata only
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ethz.rosetta.installDate
2017-11-06T10:29:27Z
ethz.rosetta.lastUpdated
2021-02-14T20:01:16Z
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true
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