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dc.contributor.author
Schneider, Arno
dc.contributor.author
Günter, Peter
dc.date.accessioned
2017-06-08T15:23:58Z
dc.date.available
2017-06-08T15:23:58Z
dc.date.issued
2006
dc.identifier.issn
0003-6935
dc.identifier.issn
1559-128X
dc.identifier.issn
2155-3165
dc.identifier.other
10.1364/AO.45.006598
dc.identifier.uri
http://hdl.handle.net/20.500.11850/1096
dc.language.iso
en
dc.publisher
Optical Society of America
dc.title
Measurement of the terahertz-induced phase shift in electro-optic sampling for an arbitrary biasing phase
dc.type
Journal Article
ethz.journal.title
Applied optics
ethz.journal.volume
45
ethz.journal.issue
25
ethz.journal.abbreviated
Appl. opt.
ethz.pages.start
6598
ethz.pages.end
6601
ethz.notes
Received 17 January 2006, Accepted 13 April 2006, Posted 18 April 2006.
ethz.identifier.nebis
000038982
ethz.publication.place
Washington, DC
ethz.publication.status
published
ethz.leitzahl
03255 - Günter, Peter
ethz.leitzahl.certified
03255 - Günter, Peter
ethz.date.deposited
2017-06-08T15:24:20Z
ethz.source
ECIT
ethz.identifier.importid
imp59364b385f00179957
ethz.ecitpid
pub:10878
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-26T04:57:51Z
ethz.rosetta.lastUpdated
2018-08-02T03:08:46Z
ethz.rosetta.versionExported
true
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