In situ compression tests on micron-sized silicon pillars by Raman microscopy

Open access
Date
2008Type
- Journal Article
ETH Bibliography
yes
Altmetrics
Permanent link
https://doi.org/10.3929/ethz-b-000011008Publication status
publishedExternal links
Journal / series
Journal of Materials ResearchVolume
Pages / Article No.
Publisher
MRSOrganisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph
Notes
Received 16 May 2008, Accepted 8 August 2008. It was possible to publish this article open access thanks to a Swiss National Licence with the publisherMore
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ETH Bibliography
yes
Altmetrics