In situ compression tests on micron-sized silicon pillars by Raman microscopy

Stress measurements and deformation analysis
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Author
Wasmer, K.
Wermelinger, T.
Bidiville, A.
Spolenak, R.
Michler, J.
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Date
2008
Type
  • Journal Article
Publication status
published
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Journal / series
Journal of materials research
Volume
23(11)
Pages / Article No.
3040 - 3047
Publisher
MRS
Organisational unit
03692 - Spolenak, Ralph  
Notes
Received 16 May 2008, Accepted 8 August 2008.
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Citations
Cited 13 times in Web of Science
ETH Bibliography
yes
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