In situ compression tests on micron-sized silicon pillars by Raman microscopy

Stress measurements and deformation analysis
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Author
Wasmer, K.
Wermelinger, T.
Bidiville, A.
Spolenak, R.
Michler, J.
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Date
2008
Type
    Journal Article
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-b-000011008
Publication status
published
External links
Journal / series
Journal of Materials Research
Volume
23(11)
Pages / Article No.
3040 - 3047
Publisher
MRS
Organisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph  
Notes
Received 16 May 2008, Accepted 8 August 2008. It was possible to publish this article open access thanks to a Swiss National Licence with the publisher
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