Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation
- Journal Article
Journal / seriesActa Materialia
Pages / Article No.
SubjectThin films; Plastic deformation; Tension test; X-ray diffraction (XRD); Synchrotron radiation
Organisational unit03692 - Spolenak, Ralph / Spolenak, Ralph
NotesReceived 24 August 2007. revised 19 December 2007. accepted 15 January 2008. available online 7 March 2008.
MoreShow all metadata