Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation
A study by synchrotron and bulge test techniques
Metadata only
Datum
2008Typ
- Journal Article
Publikationsstatus
publishedExterne Links
Zeitschrift / Serie
Acta MaterialiaBand
Seiten / Artikelnummer
Verlag
ElsevierThema
Thin films; Plastic deformation; Tension test; X-ray diffraction (XRD); Synchrotron radiationOrganisationseinheit
03692 - Spolenak, Ralph / Spolenak, Ralph
Anmerkungen
Received 24 August 2007. revised 19 December 2007. accepted 15 January 2008. available online 7 March 2008.