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dc.contributor.author
Gruber, Patric A.
dc.contributor.author
Boehm, Jochen
dc.contributor.author
Onuseit, Felix
dc.contributor.author
Wanner, Alexander
dc.contributor.author
Spolenak, Ralph
dc.contributor.author
Arzt, Eduard
dc.date.accessioned
2017-06-08T20:06:36Z
dc.date.available
2017-06-08T20:06:36Z
dc.date.issued
2008
dc.identifier.other
10.1016/j.actamat.2008.01.027
dc.identifier.uri
http://hdl.handle.net/20.500.11850/11014
dc.language.iso
en
dc.publisher
Elsevier
dc.subject
Thin films
dc.subject
Plastic deformation
dc.subject
Tension test
dc.subject
X-ray diffraction (XRD)
dc.subject
Synchrotron radiation
dc.title
Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation
dc.type
Journal Article
ethz.title.subtitle
A study by synchrotron and bulge test techniques
ethz.journal.title
Acta Materialia
ethz.journal.volume
56
ethz.journal.issue
10
ethz.pages.start
2318
ethz.pages.end
2335
ethz.notes
Received 24 August 2007. revised 19 December 2007. accepted 15 January 2008. available online 7 March 2008.
ethz.identifier.wos
ethz.identifier.nebis
001553978
ethz.publication.place
Amsterdam
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
ethz.date.deposited
2017-06-08T20:06:38Z
ethz.source
ECIT
ethz.identifier.importid
imp59364bfbcc1b785129
ethz.ecitpid
pub:22112
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T20:01:25Z
ethz.rosetta.lastUpdated
2020-02-14T05:24:13Z
ethz.rosetta.versionExported
true
ethz.COinS
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