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dc.contributor.author
Xu, Xinxing
dc.contributor.author
Li, Wen
dc.contributor.author
Xu, Dong
dc.contributor.author
Tsang, Ivor
dc.date.accessioned
2017-06-11T23:05:21Z
dc.date.available
2017-06-11T23:05:21Z
dc.date.issued
2015
dc.identifier.issn
0162-8828
dc.identifier.issn
1939-3539
dc.identifier.other
10.1109/TPAMI.2015.2476813
dc.identifier.uri
http://hdl.handle.net/20.500.11850/110366
dc.language.iso
en
dc.publisher
IEEE
dc.title
Co-Labeling for Multi-view Weakly Labeled Learning
dc.type
Journal Article
ethz.journal.title
IEEE Transactions on Pattern Analysis and Machine Intelligence
ethz.journal.volume
38
ethz.journal.issue
6
ethz.journal.abbreviated
IEEE Trans. Pattern Anal. Mach. Intell.
ethz.pages.start
1113
ethz.pages.end
1125
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
000019888
ethz.publication.place
New York, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02652 - Institut für Bildverarbeitung / Computer Vision Laboratory::03514 - Van Gool, Luc / Van Gool, Luc
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02652 - Institut für Bildverarbeitung / Computer Vision Laboratory::03514 - Van Gool, Luc / Van Gool, Luc
ethz.date.deposited
2017-06-11T23:05:37Z
ethz.source
ECIT
ethz.identifier.importid
imp593653f2d970072488
ethz.ecitpid
pub:171593
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T23:02:53Z
ethz.rosetta.lastUpdated
2018-11-02T21:34:49Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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